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Noticeable impact of Er doping on structural, vibrational, optical, dielectric and electrical parameters of flash combustion synthesized NiO NPs for optoelectronic applications
Inorganic Chemistry Communications ( IF 3.8 ) Pub Date : 2020-11-01 , DOI: 10.1016/j.inoche.2020.108229
Mohd. Shkir

Abstract A facile synthesis of erbium doped nickel oxide (Er@NiO) was accomplished via combustion route at 550 °C within 2 h. Cubic phase of all Er@NiO samples was confirmed by X-ray diffraction (XRD) and Rietveld refinement methods. All XRD profiles were fitted well by Rietveld. XRD data was used to determine the values of size, dislocations, strain and the size was reduced from 26 to 8 nm on rising the Er content in NiO. Vibrational spectroscopy also approved the synthesis of NiO without any impurity content at all Er concentrations. The composition of Ni, O and Er was evaluated by EDX and their uniform dispersal in final product was confirmed by SEM e-mapping. Further, SEM study confirms very compact nanostructure of final products and the size reduction was observed by Er content. Kubelka-Munk methodology was employed to attain the bandgap of all Er@NiO NPs and lies between 3.17 and 3.50 eV. The e ' values are lies between 65–115 at 3 kHz and 18–36 at 3 MHz, however, it was higher for 5 wt% Er@NiO NPs compare to other at 3 kHz and lower after 7 kHz. The ac conductivity and conduction behaviour were also inveterate and conferred.

中文翻译:

Er掺杂对用于光电应用的闪光燃烧合成NiO NP的结构、振动、光学、介电和电学参数的显着影响

摘要 通过燃烧路线在 550 °C 下在 2 h 内完成了掺铒氧化镍 (Er@NiO) 的简便合成。通过 X 射线衍射(XRD)和 Rietveld 精修方法确认了所有 Er@NiO 样品的立方相。Rietveld 对所有 XRD 曲线进行了拟合。XRD 数据用于确定尺寸、位错、应变的值,随着 NiO 中 Er 含量的增加,尺寸从 26 nm 减小到 8 nm。振动光谱也证实了 NiO 的合成,在所有 Er 浓度下都没有任何杂质含量。通过 EDX 评估 Ni、O 和 Er 的组成,并通过 SEM 电子映射确认它们在最终产品中的均匀分散。此外,SEM 研究证实了最终产品的纳米结构非常紧凑,并且通过 Er 含量观察到尺寸减小。Kubelka-Munk 方法用于获得所有 Er@NiO NP 的带隙,其带隙介于 3.17 和 3.50 eV 之间。e ' 值在 3 kHz 时介于 65-115 和 3 MHz 时为 18-36 之间,但是,与其他 3 kHz 时相比,5 wt% Er@NiO NPs 更高,7 kHz 后更低。交流电导率和传导行为也是根深蒂固和赋予的。
更新日期:2020-11-01
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