Abstract The study investigates the use of scattering parameters measurement to retrieve the permittivity, permeability, refractive index and intrinsic impedance of materials over the wide range of frequencies. The approach is demonstrated for thin as well as thick materials to clarify the complex branching problems of the logarithm and sign ambiguities. The special requirement of simulation and measurement setup and their alternative solution are also suggested in this work. The paper aims to simplify and streamline the approach of parameter retrieval for any thickness of material. The approach is verified using CST Microwave studio simulation and results obtained are validated using rectangular waveguide measurement method.

中文翻译：

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用于介电常数和渗透率测量的厚度不变参数检索技术

摘要 该研究调查了使用散射参数测量来检索材料在宽频率范围内的介电常数、磁导率、折射率和固有阻抗。该方法适用于薄材料和厚材料，以阐明对数和符号模糊的复杂分支问题。在这项工作中还提出了模拟和测量设置的特殊要求及其替代解决方案。本文旨在简化和简化任何厚度材料的参数检索方法。该方法使用 CST 微波工作室模拟进行验证，获得的结果使用矩形波导测量方法进行验证。