Abstract

By examples of multilayered film structure Cu/[FeNi/Cu]₁₀ deposited by the method of ion-plasma sputtering, a comparative analysis of the magnetic hysteresis loops measured on a vibrating magnetometer, a magnetic measuring complex with primary converter on the basis of SQUID (SQUID magnetometer), and a magneto-optical Kerr microscope is carried out. The use of a SQUID magnetometer made it possible to detect the step-by-step nature of remagnetization of the film structure, the presence of which was confirmed by observations on the Kerr microscope in the quasi-static remagnetization mode.

中文翻译：

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多层坡莫合金基薄膜结构中的退磁过程

摘要

以通过离子等离子溅射法沉积的多层膜结构Cu / [FeNi / Cu] ₁₀为例，对振动磁强计，基于SQUID的带有初级转换器的磁测量复合体测量的磁滞回线进行了比较分析。 （SQUID磁力计），并进行磁光克尔显微镜。使用SQUID磁力计可以检测膜结构的复磁的逐步特性，其存在已通过在准静态复磁模式下在Kerr显微镜上的观察得到证实。