Abstract The optical constants and thickness of CdSe thin films prepared by quasi close-space sublimation method are determined. The structural investigations performed by means of XRD technique showed that the films have a polycrystalline and hexagonal structure. The optical constants and the band gap of the films under study have been determined (Eg= 1.68 eV). Optical properties (refractive index n(λ), absorption coefficient α(λ), and extinction coefficient k(λ)) of thin films and thickness d can be determined from the transmission spectrum. The dispersion of the refractive index was explained using a single oscillator model. Single oscillator energy and dispersion energy are obtained from fitting. Optical parameters of the films were determined using the Cauchy, Sellmeier and Wemple models.

中文翻译：

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CdSe薄膜的光能特性

摘要 确定了准近空间升华法制备的CdSe薄膜的光学常数和厚度。通过XRD技术进行的结构研究表明，薄膜具有多晶和六方结构。已确定所研究薄膜的光学常数和带隙 (Eg = 1.68 eV)。薄膜的光学特性（折射率 n(λ)、吸收系数 α(λ) 和消光系数 k(λ)）和厚度 d 可以从透射光谱中确定。使用单振荡器模型解释了折射率的色散。拟合得到单振子能量和色散能量。薄膜的光学参数使用 Cauchy、Sellmeier 和 Wemple 模型确定。