ABSTRACT We present a simple and effective approach to improve X-ray data collected under extreme conditions of pressure and temperature. The X-ray data of the sample and the amorphous, liquid, or crystalline pressure transmitting media (PTM) which surround the sample are collected separately at each pressure and temperature, allowing a satisfactory background subtraction. Using this method, we are able to identify weak diffraction peaks of the low-Z elements Li and Na and amorphous silica under pressure and at cryogenic temperatures. In addition to exploration of phase diagrams of low-Z materials, this method can also be applied to recognize new phases of other unknown materials such as binary hydrides in the high pressure and high-temperature synthesis, and to allow deterministic identification of the onset pressure of structural phase transitions and the presence of mixed phases.

中文翻译：

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用于高压 X 射线数据分析的金刚石砧座中的并行背景减除

摘要 我们提出了一种简单有效的方法来改进在极端压力和温度条件下收集的 X 射线数据。在每个压力和温度下分别收集样品和样品周围的无定形、液体或结晶压力传输介质 (PTM) 的 X 射线数据，从而实现令人满意的背景扣除。使用这种方法，我们能够在压力和低温下识别低 Z 元素 Li 和 Na 以及无定形二氧化硅的弱衍射峰。除了探索低Z材料的相图外，该方法还可用于识别其他未知材料的新相，例如高压高温合成中的二元氢化物，