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Atmospheric-pressure spatial chemical vapor deposition of tungsten oxide
Journal of Vacuum Science & Technology A ( IF 2.4 ) Pub Date : 2020-09-02 , DOI: 10.1116/6.0000347
Travis Wen-Kai Yeow 1, 2 , Kissan Mistry 1, 2 , Ahmed Shahin 1, 2 , Mustafa Yavuz 1, 2 , Kevin P. Musselman 1, 2
Affiliation  

Atmospheric-pressure spatial atomic layer deposition (AP-SALD) and atmospheric-pressure spatial chemical vapor deposition (AP-SCVD) are rapid, open-air techniques for the deposition of conformal, pinhole-free films over large areas. In this work, a precursor nebulizer and an ozone generator are incorporated into an AP-SALD system to enable the deposition of tungsten oxide (WO3) films by AP-SCVD. The precursors bis(t-butylimido) bis(dimethylamino) tungsten(VI) and ozone are used with a film deposition temperature of 350 °C to achieve a growth per cycle of 1.2 Å/cycle. A bandgap of 3.26 eV and a refractive index of 2.36 were obtained, consistent with the previous reports for WO3 films. The pinhole-free films were found to be a mixture of hexagonal and monoclinic WO3, with an increasing monoclinic nature after annealing. Additionally, the as-deposited film was substoichiometric with an O/W ratio of 2.3, which increased to 2.36 after annealing at 450 °C. The successful open-air deposition of tungsten oxide via the incorporation of a precursor nebulizer and ozone generator paves the way for large-area deposition of tungsten oxide for commercial applications.

中文翻译:

氧化钨的大气压空间化学气相沉积

大气压空间原子层沉积(AP-SALD)和大气压空间化学气相沉积(AP-SCVD)是一种快速的露天技术,用于在大面积区域上沉积保形,无针孔的薄膜。在这项工作中,将前驱雾化器和臭氧发生器合并到AP-SALD系统中,以通过AP-SCVD沉积氧化钨(WO 3)膜。使用前驱体双(叔丁基亚氨基)双(二甲基氨基)钨(VI)和臭氧,膜沉积温度为350°C,以使每个周期的生长达到1.2Å/周期。获得了3.26eV的带隙和2.36的折射率,这与WO 3膜的先前报道一致。发现无针孔的薄膜是六方晶系和单斜晶系WO 3的混合物,退火后单斜性增加。另外,所沉积的膜是亚化学计量的,O / W比为2.3,在450℃下退火后增加至2.36。通过结合使用前体雾化器和臭氧发生器成功地在露天沉积氧化钨,为大面积沉积氧化钨铺平了道路,为商业应用铺平了道路。
更新日期:2020-09-10
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