Charge trapping degrades the energy resolution of germanium (Ge) detectors, which require increased experimental sensitivity in searching for dark matter and neutrinoless double-beta decay. We investigate the charge trapping processes utilizing nine planar detectors fabricated from USD-grown crystals with well-known net impurity levels. The charge collection efficiency as a function of charge trapping length is derived from the Shockley–Ramo theorem. Furthermore, we develop a model that correlates the energy resolution with the charge collection efficiency. This model is then applied to the experimental data. As a result, charge collection efficiency and charge trapping length are determined accordingly. Utilizing the Lax model (further developed by CDMS collaborators), the absolute impurity levels are determined for nine detectors. The knowledge of these parameters when combined with other traits such as the Fano factor serve as a reliable indicator of the intrinsic nature of c...

中文翻译：

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稀有物理搜索中电荷陷阱对Ge探测器能量分辨率的影响

电荷陷阱会降低锗（Ge）检测器的能量分辨率，这需要增加在寻找暗物质和无中微子双β衰变中的实验灵敏度。我们研究了九个平面探测器的电荷俘获过程，这些探测器由美元生长的晶体制成，具有众所周知的净杂质水平。电荷收集效率与电荷俘获长度的关系是从Shockley-Ramo定理得出的。此外，我们开发了一个模型，该模型将能量分辨率与电荷收集效率相关联。然后将此模型应用于实验数据。结果，电荷收集效率和电荷俘获长度被相应地确定。利用Lax模型（由CDMS合作者进一步开发），为9个检测器确定了绝对杂质水平。