当前位置: X-MOL 学术Semiconductors › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Features of the Vapor-Phase Epitaxy of GaAs on Nonplanar Substrates
Semiconductors ( IF 0.6 ) Pub Date : 2020-09-08 , DOI: 10.1134/s1063782620090080
Yu. N. Drozdov , S. A. Kraev , A. I. Okhapkin , V. M. Daniltsev , E. V. Skorokhodov

Abstract

The features of the surface shape of GaAs epitaxial layers grown on grooves several micrometers wide with vertical walls and an aspect ratio close to unity are investigated. The grooves are formed on the surface of a GaAs wafer in a plasma-chemical etching installation and overgrown by organometallic vapor-phase epitaxy under reduced pressure in a reactor.



中文翻译:

非平面衬底上GaAs气相外延的特征

摘要

研究了GaAs外延层表面形状的特征,该GaAs外延层生长在几微米宽,垂直壁长宽比接近于1的沟槽上。所述凹槽在等离子体化学蚀刻设备中形成在GaAs晶片的表面上,并且在反应器中在减压下被有机金属气相外延生长。

更新日期:2020-09-08
down
wechat
bug