The morphology and microtexture of poly(o-ethoxyaniline) thin films deposited on the ITO substrate by electrodeposition were investigated. Cyclic voltammetry and FTIR were used to characterize the molecular structure, while Atomic Force Microscopy (AFM) technique was applied to obtain topographical images. The images were analyzed using commercial and free software. Moreover, three new parameters such as surface entropy, fractal succolarity, and fractal lacunarity were evaluated using recently developed theoretical models. The results showed that the morphology was affected according to the deposition cycles, while the analysis of the molecular structure indicated an increase in the polymer’s conjugation, mainly from 5 to 15 cycles. Structures related to the growth of poly(o-ethoxyaniline) were observed due to the increase in the number of deposition cycles. However, films did not grow completely. The microtexture was homogenized as the number of cycles increased. Furthermore, topographical uniformity was high for all films. Percolation remained low for all films, showing that although the formation of films was not completed, the microtexture of the material tended to homogenize as the film grew. These results revealed that the used tools can quantify the surface parameters, which are of great interest for the study of the corrosive properties of polymeric thin films.

研究了电沉积在ITO衬底上的聚（邻乙氧基苯胺）薄膜的形貌和微观结构。循环伏安法和FTIR用于表征分子结构，而原子力显微镜（AFM）技术则用于获取形貌图像。使用商业和免费软件对图像进行了分析。此外，使用新近开发的理论模型评估了三个新参数，例如表面熵，分形蔗糖度和分形腔隙度。结果表明，形态受到沉积周期的影响，而对分子结构的分析表明，聚合物的共轭作用增加，主要是从5到15个周期。与poly（o-乙氧基苯胺）由于沉积循环数的增加而被观察到。但是，电影并没有完全成长。随着循环次数的增加，微纹理被均质化。此外，所有薄膜的地形均匀性都很高。所有膜的渗滤率仍然很低，这表明尽管膜的形成尚未完成，但随着膜的生长，材料的微观结构趋于均匀。这些结果表明，所使用的工具可以量化表面参数，这对于研究聚合物薄膜的腐蚀性能非常重要。