This article presents a study of different calibration techniques for vector network analyzer -based material measurements using commercially available material characterization kits (MCKs). Such MCKs are designed for fast broadband material characterization at millimeter-wave and terahertz frequencies and are based on gated-reflect-line calibration for removal of errors associated with the fixture. In this article, we have applied thru-reflect-line (TRL) calibration to the MCKs, yielding robust S-parameters that are used to calculate the relative permittivity and loss tangent of materials. Two different types of line standards, i.e., custom machined corrugated lines and air lines (a quarter-wave air gap between the ports of the MCKs), were employed to produce the desired phase shift. Both types of standard produced similar results. These investigations were carried out on three types of low-loss dielectric material, using MCKs operating at two selected waveguides bands within the range 140–750 GHz. The same samples were measured using time-domain spectroscopy (TDS) for comparison. The extracted relative permittivities and loss tangents using MCKs with TRL calibration and TDS are compared against literature values. Good agreement is achieved.

中文翻译：

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使用经过反射线校准的基于 VNA 的材料表征套件进行材料测量

本文介绍了使用市售材料表征套件 (MCK) 进行基于矢量网络分析仪的材料测量的不同校准技术的研究。此类 MCK 专为毫米波和太赫兹频率下的快速宽带材料表征而设计，并基于门控反射线校准以消除与夹具相关的误差。在本文中，我们对 MCK 应用了直通反射线 (TRL) 校准，产生稳健的 S 参数，用于计算材料的相对介电常数和损耗角正切。两种不同类型的线路标准，即定制加工的波纹线路和空气线路（MCK 端口之间的四分之一波气隙），用于产生所需的相移。两种类型的标准产生了相似的结果。这些研究是对三种类型的低损耗介电材料进行的，使用 MCK 在 140–750 GHz 范围内的两个选定波导频段上运行。使用时域光谱 (TDS) 测量相同的样品以进行比较。将使用带有 TRL 校准和 TDS 的 MCK 提取的相对介电常数和损耗角正切与文献值进行比较。达成了良好的协议。