This article presents a time-domain imaging technique for layered dielectric slabs using a solid-state wavelet generator with subterahertz carrier frequency. The technique utilizes the dual nature of a wavelet, i.e., both the applicability of time-of-flight measurements and the ability of wavelets to interfere in thin dielectric layers at a carrier frequency that is preserved in spite of the ultrawideband character of the signal. This results in a very high sensitivity of the time delay of the resultant pulse to variations in the effective thickness (thickness × refractive index) of the dielectric layer. It is shown using a plane-wave analysis of the pulse propagation that under certain conditions, this sensitivity enhancement can reach an order of magnitude. The experimental setup for the reflection-mode operation is described and its performance in the discrimination of healthy and malignant tissues and in the detection of corrosion under paint is demonstrated.

中文翻译：

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具有干涉测量增强灵敏度的分层介电结构的时域太赫兹成像

本文介绍了一种使用具有亚赫兹载波频率的固态小波发生器的分层介电板的时域成像技术。该技术利用了小波的双重性质，即飞行时间测量的适用性和小波以载波频率干扰薄介电层的能力，尽管信号具有超宽带特性，但仍保持载波频率。这导致合成脉冲的时间延迟对介电层有效厚度（厚度 × 折射率）的变化非常敏感。使用脉冲传播的平面波分析表明，在某些条件下，这种灵敏度增强可以达到一个数量级。