In this work, the stress gradient in mechanically polished tungsten sample was studied using X-ray diffraction methods. To determine in-depth stress evolution in the very shallow subsurface region (up to 10 μm), special methods based on reflection geometry were applied. The subsurface stresses (depth up to 1 μm) were measured using the multiple-reflection grazing incidence X-ray diffraction method with classical characteristic X-rays, while the deeper volumes (depth up to 10 μm) were investigated using energy-dispersive diffraction with white high energy synchrotron beam. Both complementary methods allowed for determining in-depth stress profile and the evolution of stress-free lattice parameter. It was confirmed that the crystals of tungsten are elastically isotropic, which simplifies the stress analysis and makes tungsten a suitable material for testing stress measurement methods. Furthermore, it was found that an important compressive stress of about − 1000 MPa was generated on the surface of the mechanically polished sample, and this stress decreases to zero value at the depth of about 9 μm. On the other hand, the strain-free lattice parameter does not change significantly in the examined subsurface region.

在这项工作中，使用X射线衍射方法研究了机械抛光钨样品中的应力梯度。为了确定在很浅的地下区域深入应力演进（最多10  μ M），是根据反射几何特殊方法应用于。地下应力（深度达1  μ米）用的多重反射放牧与经典的特征X射线射X射线衍射法测定，而较深的体积（深度多达10  μm）使用白色高能同步加速器束的能量色散衍射进行了研究。两种互补方法都可以确定深度应力分布和无应力晶格参数的演变。证实了钨的晶体是弹性各向同性的，这简化了应力分析并使钨成为测试应力测量方法的合适材料。此外，人们发现，大约的重要压缩应力-机械抛光样品的表面上生成1000兆帕，该应力在约9的深度减小到零值 μ米。另一方面，无应变晶格参数在检查的地下区域中没有显着变化。