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Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2020-09-03 , DOI: 10.1017/s1431927620024393 Xavier Llovet 1 , Joaquín A Proenza 2 , Núria Pujol-Solà 2 , Júlia Farré-de-Pablo 2 , Marc Campeny 3
中文翻译：
矿物包裹体电子探针显微分析中跨相界二次荧光的校正
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2020-09-03 , DOI: 10.1017/s1431927620024393 Xavier Llovet 1 , Joaquín A Proenza 2 , Núria Pujol-Solà 2 , Júlia Farré-de-Pablo 2 , Marc Campeny 3
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中文翻译：
矿物包裹体电子探针显微分析中跨相界二次荧光的校正
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