当前位置: X-MOL 学术Commun. Stat. Simul. Comput. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
The effect of parameter estimation on X¯ control charts for the lognormal distribution
Communications in Statistics - Simulation and Computation ( IF 0.8 ) Pub Date : 2020-09-03 , DOI: 10.1080/03610918.2020.1812648
Wei-Heng Huang

Abstract

Statistical process control (SPC) is a method of monitoring, controlling and improving a process through statistical analysis. In real applications, many industrial process data may follow a positively-skewed distribution such as the lognormal distribution. In this article, under lognormal process, we study the performance of three X¯ control charts, Shewhart control chart, weighted variance control chart and weighted standard deviation control chart, based on the in-control expected average run length (AARL). The standard deviation of ARL (SDARL) metric is used to evaluate the performance for various amounts of phase I data. A formula to approximate the ARL by the normal approximation method is established in this study. The in-control and out-of-control performance of the three X¯ control charts are compared based on the normal approximation and simulation.



中文翻译:

参数估计对对数正态分布 X¯ 控制图的影响

摘要

统计过程控制 (SPC) 是一种通过统计分析来监控、控制和改进过程的方法。在实际应用中,许多工业过程数据可能遵循正偏分布,例如对数正态分布。在本文中,在对数正态过程下,我们研究了三个X¯控制图、休哈特控制图、加权方差控制图和加权标准偏差控制图,基于在控制的预期平均运行长度 (AARL)。ARL 标准差 (SDARL) 度量标准用于评估不同数量的第一阶段数据的性能。本研究建立了一个用正态逼近法逼近ARL的公式。三者的受控与失控表现X¯控制图基于正态近似和模拟进行比较。

更新日期:2020-09-03
down
wechat
bug