Polycrystal orientation mapping techniques based on full-field acquisition schemes like X-ray Diffraction Contrast Tomography and certain other variants of 3D X-ray Diffraction or near-field High Energy Diffraction Microscopy enable time efficient mapping of 3D grain microstructures. The spatial resolution obtained with this class of monochromatic beam X-ray diffraction imaging approaches remains typically below the ultimate spatial resolution achievable with X-ray imaging detectors. Introducing a generalised reconstruction framework enabling the combination of acquisitions with different detector pixel size and sample tilt settings provide a pathway towards 3D orientation mapping with a spatial resolution approaching the one of state of the art X-ray imaging detector systems.

基于全场采集方案（如X射线衍射对比断层扫描）和3D X射线衍射或近场高能衍射显微术的某些其他变体的多晶取向映射技术可实现3D晶粒微观结构的高效映射。用此类单色光束X射线衍射成像方法获得的空间分辨率通常保持在X射线成像探测器可达到的最终空间分辨率以下。引入一种通用的重建框架，该框架可将具有不同检测器像素大小和采样倾斜设置的采集结合起来，从而提供了一条通往3D方向映射的途径，其空间分辨率接近最先进的X射线成像检测器系统之一。