The paper considers an improved waveguide method for determining the complex dielectric and magnetic permeabilities of materials that does not require measuring the distance from the planes of the sample to the calibration planes. Verification of this method and comparison of the obtained results with the classical waveguide method using a high-resistance silicon sample as an example showed a decrease in the error in determining the tangents of the dielectric and magnetic loss angles, as well as the real component of the complex magnetic permeability.

中文翻译：

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使用波导方法提高在微波范围内测量复介电导率和磁导率的精度

本文考虑了一种用于确定材料的复杂介电和磁导率的改进的波导方法，该方法不需要测量样品平面到校准平面的距离。对该方法进行验证，并与以高电阻硅样品为例的经典波导方法进行比较，结果表明，确定介电损耗角和磁损耗角正切以及误差的实部时，误差减小了。复磁导率。