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Advances in optical metrology and instrumentation: introduction.
Journal of the Optical Society of America A ( IF 1.4 ) Pub Date : 2020-08-31 , DOI: 10.1364/josaa.405559
Jonathan D Ellis , Han Haitjema , Xiangqian Jiang , Ki-Nam Joo , Richard Leach

Optical measurement and characterization are two of the pillars of metrology. The ability to measure precisely with high dynamic range and accuracy betters our understanding of nature and the universe. In this feature issue, we present a collection of articles that delves into the fundamental techniques used to advance the field.

中文翻译:

光学计量学和仪器仪表的进展:简介。

光学测量和表征是计量学的两个支柱。以高动态范围和精度进行精确测量的能力使我们对自然和宇宙有了更好的理解。在本期特刊中,我们提供了一系列文章,探讨了用于推动该领域发展的基本技术。
更新日期:2020-09-02
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