Abstract The effects of initial twinned microstructure on the grain growth behavior of four sputtered nanotwinned copper alloys were compared. As-deposited films were characterized by transmission electron microscopy and the microstructural evolution of the annealed samples was investigated through electron backscatter diffraction. Texture showed a pronounced effect, where films with strong {111} textures exhibited abnormal grain growth that was not observed in a randomly textured film. Additionally, the stability induced by twin boundaries appears to be limited, as the excess energy generated by a large twin density could drive the early onset of abnormal grain growth and recrystallization.

中文翻译：

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高度纳米孪晶合金的晶界演化：初始孪晶微观结构的影响

摘要 比较了初始孪晶组织对四种溅射纳米孪晶铜合金晶粒长大行为的影响。通过透射电子显微镜表征沉积的薄膜，并通过电子背散射衍射研究退火样品的微观结构演变。纹理显示出明显的效果，其中具有强 {111} 纹理的薄膜表现出异常的晶粒生长，这在随机纹理的薄膜中没有观察到。此外，孪晶界引起的稳定性似乎是有限的，因为大孪晶密度产生的多余能量可能会导致异常晶粒生长和再结晶的早期发生。