This brief presents an all-digital CMOS pulse-shrinking time-to-digital converter (TDC) with temperature-measuring capability for higher circuit value and cost saving. A pulse generator is proposed to generate either a time-added pulse or a temperature-sensing pulse. A cyclic delay line (DL) composed of a temperature-sensing DL and a pulse-shrinking DL becomes area efficient and achieves sufficiently wide dynamic range. A time subtractor that eliminates the effect of the offset error enhances accuracy. The proposed TDC is fabricated with TSMC 0.35- $\mu \text{m}$ CMOS process and has a small area of approximately 0.019 mm2. The effective time resolution is approximately 45 ps, with an integral nonlinearity of −0.5 to 0.85 least significant bit (LSB). The achieved temperature resolution is nearly 0.1 °C/LSB, with an inaccuracy of −1.35 °C to 0.7 °C for a range of 0 °C–90 °C. Experimental results prove that we have proposed the first TDC that successfully measures time and temperature.

中文翻译：

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具有温度测量功能的全数字 CMOS 时间数字转换器

本简介介绍了一种具有温度测量功能的全数字 CMOS 脉冲收缩时间数字转换器 (TDC)，可提高电路价值并节省成本。建议使用脉冲发生器来生成时间添加脉冲或温度感应脉冲。由温度传感 DL 和脉冲收缩 DL 组成的循环延迟线 (DL) 具有面积效率并实现足够宽的动态范围。消除偏移误差影响的时间减法器可提高精度。所提出的 TDC 是用 TSMC 0.35-$\mu\text{m}$ CMOS 工艺制造的，并且具有大约 0.019 mm2 的小面积。有效时间分辨率约为 45 ps，具有 -0.5 至 0.85 最低有效位 (LSB) 的积分非线性。实现的温度分辨率接近 0.1 °C/LSB，误差为 -1.35 °C 至 0。7 °C 的范围为 0 °C–90 °C。实验结果证明我们提出了第一个成功测量时间和温度的TDC。