Recently, organic–inorganic hybrid metal halide perovskite (O-IHMHP) has been diffusely used in solar cells due to its remarkable photoelectric property and inexpensive film-forming process. Since organic–inorganic hybrid metal halide perovskite solar cells (O-IHMHPSCs) were introduced in 2009, their photoelectric conversion efficiency has been increased to 25.2%, and their lifespan has been extended to tens of thousands of hours. However, due to processing factors, defects consist in the interfaces of O-IHMHP with the electron transport layer and the hole transport layer. To improve the stability and property of O-IHMHPSCs, these defects must be addressed; to do so, passivation is commonly applied at the interface. This work reviews research on the interface passivation of O-IHMHPSCs. Here, the passivation mechanisms of different additives on the interface defects of O-IHMHP films are analyzed, their impacts on the stability and property of O-IHMHPSCs are compared, and their roles in O-IHMHPSCs are summarized. Finally, the research and development trends of the defect passivation of O-IHMHPSCs are discussed.

近年来，由于其出色的光电性能和廉价的成膜工艺，有机-无机杂化金属卤化物钙钛矿（O-IHMHP）被广泛用于太阳能电池。自2009年引入有机-无机杂化金属卤化物钙钛矿型太阳能电池（O-IHMHPSC）以来，其光电转换效率已提高到25.2％，并且使用寿命已延长至数万小时。然而，由于加工因素，缺陷在于O-IHMHP与电子传输层和空穴传输层的界面。为了提高O-IHMHPSC的稳定性和性能，必须解决这些缺陷。为此，通常在接口处应用钝化。这项工作回顾了有关O-IHMHPSC的接口钝化的研究。这里，分析了不同添加剂对O-IHMHPSC薄膜界面缺陷的钝化机理，比较了它们对O-IHMHPSCs稳定性和性能的影响，总结了它们在O-IHMHPSCs中的作用。最后，讨论了O-IHMHPSCs缺陷钝化的研究和发展趋势。