Abstract In this work, the limit of application of the kinematical theory of X-ray diffraction was calculate integrated intensities was evaluated as a function of perfect crystal thickness, when compared with the Ewald–Laue dynamical theory. The percentual difference between the dynamical and kinematical integrated intensities was calculated as a function of unit cell volume, Bragg angle, wavelength, module, and phase of structure factor and linear absorption coefficient. A critical thickness was defined to be the value for which the intensities differ 5%. We show that this critical thickness is 13.7% of the extinction length, which a specific combination of the parameters mentioned before. Also, we find a general expression, for any percentage of the difference between both theories, to determine the validity of the application of the kinematical theory. Finally, we also showed that the linear absorption decreases this critical thickness.

中文翻译：

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X射线衍射运动学理论的应用极限研究

摘要 在这项工作中，与 Ewald-Laue 动力学理论相比，X 射线衍射运动学理论的应用极限是计算积分强度作为完美晶体厚度的函数。动力学和运动学积分强度之间的百分比差异计算为晶胞体积、布拉格角、波长、模块和结构因子相位和线性吸收系数的函数。临界厚度定义为强度相差 5% 的值。我们表明，这个临界厚度是消光长度的 13.7%，这是前面提到的参数的特定组合。此外，我们找到了一个通用表达式，对于两种理论之间差异的任何百分比，确定运动学理论应用的有效性。最后，我们还表明线性吸收降低了这个临界厚度。