Pure and yttrium-doped tin oxide (SnO₂:Y) thin film was successfully coated on a glass substrate using a nebulizer spray pyrolysis technique with a constant temperature of 400 °C. Coated films are characterized by a variety of techniques like XRD, SEM with EDX, TEM, elemental mapping, UV, PL, and gas sensors. All XRD film patterns demonstrate a well-defined polycrystalline phase, which fits well with the SnO₂ tetragonal rutile structure. Surface morphology analysis revealed that the surface roughness of the SnO₂:Y thin films increased with an increase in yttrium concentration. Transmission Electron Microscopy and SAED findings result suggested that the SnO₂:Y thin films were highly crystalline. The optical band gap (3.66 eV–3.81 eV) rises due to Y- doping points the credibility of SnO₂ thin films. Photoluminescence (PL) spectroscopy revealed a large number of oxygen vacancies in SnO₂:Y films. The PL intensity varies with the doping concentrations. The gas sensing capability of nanostructured films was compared to the concentration of Y-doping and NH₃ concentrations from 25 ppm to 125 ppm. For the SnO₂:Y(5 wt.%) film, a significant response with short response time and recovery time (23 s, 7 s) to 25 ppm NH₃ is observed at room temperature. The yttrium loaded SnO₂ sensor is indeed a promising candidate for NH₃ detection.

使用恒定温度为400°C的雾化器喷雾热解技术，将纯的和掺钇的氧化锡（SnO ₂：Y）薄膜成功地涂覆在玻璃基板上。涂膜的特征在于多种技术，例如XRD，带有EDX的SEM，TEM，元素映射，UV，PL和气体传感器。所有XRD膜图样均显示出明确定义的多晶相，该相与SnO ₂四方金红石结构非常吻合。表面形态分析表明，SnO ₂：Y薄膜的表面粗糙度随着钇浓度的增加而增加。透射电镜和SAED的发现结果表明SnO ₂：Y薄膜是高度结晶的。由于Y掺杂点的增加，光学带隙（3.66 eV–3.81 eV）增大了SnO ₂薄膜的可信度。光致发光（PL）光谱显示SnO ₂：Y膜中有大量的氧空位。PL强度随掺杂浓度而变化。将纳米结构膜的气体感测能力与Y掺杂浓度和NH ₃浓度（25 ppm至125 ppm）进行了比较。对于SnO ₂：Y（5 wt。％）薄膜，在室温下观察到对25 ppm NH _3的响应时间短，恢复时间短（23 s，7 s）的显着响应。钇负载的SnO ₂传感器确实是NH ₃的有希望的候选者 检测。