Abstract

Whisker microcrystals are detected by scanning electron microscopy upon the formation of film coatings of the niobium–cadmium system by the successive deposition of ultrafine niobium and cadmium particles atomized in a low-pressure plasma onto a moving substrate on samples with concentrations of 55.3–84.2 at % Cd (the remaining percentage is Nb). The crystals differ in shape, length, and diameter; such crystals are absent on film coatings of elemental cadmium. X-ray spectral analysis is used to show that the elemental composition of the whiskers corresponds to Cd. The authors confirm the assumption regarding the probability of participation of the vapor phase, represented by cadmium, due to the high relative value of the vapor pressure over nanoparticles in whisker formation.

中文翻译：

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铌-镉薄膜表面的镉晶须微晶

摘要

晶须微晶通过扫描电子显微镜在铌-镉系统的膜涂层形成时检测到，方法是将低压等离子体中雾化的超细铌和镉颗粒连续沉积到运动的基质上，样品的浓度为55.3–84.2， Cd％（剩余百分比为Nb）。晶体的形状，长度和直径都不同。元素镉的薄膜涂层中不存在此类晶体。X射线光谱分析用于显示晶须的元素组成与Cd相对应。由于晶须形成中纳米颗粒上相对较高的蒸汽压相对值，作者证实了有关以镉表示的气相参与概率的假设。