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Double- and Triple-Crystal X-Ray Diffraction Analysis of Face-Grown Gd 3 Ga 3 Al 2 O 12 :Ce Crystals
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques ( IF 0.5 ) Pub Date : 2020-08-25 , DOI: 10.1134/s1027451020040060 I. A. Eliovich , V. I. Akkuratov , A. E. Blagov , O. A. Buzanov , M. V. Korghik , A. G. Kulikov , Yu. V. Pisarevsky , P. A. Prosekov , A. V. Targonskii , M. V. Kovalchuk
中文翻译:
生长的Gd 3 Ga 3 Al 2 O 12:Ce晶体的双晶体和三晶体X射线衍射分析
更新日期:2020-08-25
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques ( IF 0.5 ) Pub Date : 2020-08-25 , DOI: 10.1134/s1027451020040060 I. A. Eliovich , V. I. Akkuratov , A. E. Blagov , O. A. Buzanov , M. V. Korghik , A. G. Kulikov , Yu. V. Pisarevsky , P. A. Prosekov , A. V. Targonskii , M. V. Kovalchuk
Abstract
Crystals of gadolinium–gallium–aluminum garnet doped with cerium ions (Gd3Ga3Al2O12:Ce) are analyzed by X-ray diffractometry and X-ray topography. These crystals have a number of unique scintillation characteristics (including a high specific light yield, fast emission kinetics, and high energy and time resolutions), which make them promising for designing detectors of ionizing radiation in a wide energy range. It is shown that the methods used make it possible to carry out the further optimization of preparation processes of bulk crystals by revealing specific features of their growth (e.g., facet inhomogeneity, which is characteristic of Czochralski-grown single crystals).中文翻译:
生长的Gd 3 Ga 3 Al 2 O 12:Ce晶体的双晶体和三晶体X射线衍射分析