High energy X-ray diffraction microscopy is one of several techniques that use spatially resolved diffraction to nondestructively map crystal unit cell orientations in three dimensions inside bulk polycrystalline samples. The near-field variant of the technique (nf-HEDM) yields grain shapes, grain boundary character information, and intra-granular orientation variations. Here, we demonstrate, through analysis of simulated and physical data sets, the extension nf-HEDM to include mapping of heterogeneous intra-granular strain states with spatial resolution on the micron scale. Sensitivity to all strain tensor components is $<5\times {10}^{-4}$. The GPU assisted implementation of an optimization algorithm is described.

高能X射线衍射显微镜技术是使用空间分辨衍射技术在散装多晶样品内部三维无损映射晶体晶胞取向的几种技术之一。该技术的近场变体（nf-HEDM）产生晶粒形状，晶界特征信息和晶粒内取向变化。在这里，我们通过对模拟和物理数据集的分析证明了扩展nf-HEDM的功能，以包括具有微米级空间分辨率的非均质颗粒内应变状态的映射。对所有应变张量分量的灵敏度为$<5\times {10}^{--4}$。描述了优化算法的GPU辅助实现。