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President's message: Special issue highlighting AUTOTESTCON 2019
IEEE Instrumentation & Measurement Magazine ( IF 1.6 ) Pub Date : 2020-08-20
Salvo Baglio, Walter Downing

It is a pleasure to welcome you all to this special edition of our IEEE Instrumentation & Measurement Magazine focused on selected papers that have been presented to the 2019 edition of AUTOTESTCON. As for every year, also last year this was a very successful and lively event. There were many attendees, interesting speeches and lots of sponsors and exhibitors. I'm sure that many of you have enjoyed the conference.

中文翻译:

总裁寄语:强调AUTOTESTCON 2019的特刊

非常荣幸地欢迎大家参加我们的IEEE仪器仪表和测量杂志特别版,该杂志着重介绍了已提交给AUTOTESTCON 2019版的精选论文。至于每年,也是去年,这是一次非常成功和生动的活动。有很多与会者,有趣的演讲,以及许多赞助商和参展商。我相信你们中的许多人都喜欢这次会议。
更新日期:2020-08-21
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