High-speed testing of digital transmission necessitates a functional test, which is typically the test performed by automatic test equipment (ATE) on military and avionics units under test (UUTs). Older military ATEs, and indeed most modern day ATEs, are not equipped with test instruments for high-speed data transmission. Typically, such high-speed test instruments are designed for signal characterizations in design verification tests, which require human interpretations. The primary purpose of military ATE is to allow non-technical soldiers or sailors to comprehensively test and diagnose all types of electronics and to derive very specific repair instructions. We introduce synthetic instruments (SIs) and show how they offer a feasible option for traditional ATEs while they are also able to test high-speed unit under test (UUT) signals. Rather than replace military ATEs, the high-speed SI solution can be integrated into existing ATEs, even legacy ATEs. The clear benefit of this approach is the extension of ATE useful life and the capability to test present and even future circuit types. It also improves the performance of military ATEs by allowing them to test multi-Gbps signals. High-speed I/O, such as the USB 3.0 that operates at 5 Gbps is discussed. (Although USB 3.0 was recently renamed as USB 3.2 Gen 1, for consistency in this article, we use the traditional term USB 3.0.) The example utilizes a special-purpose USB 3.0 SI that responds to commands in the test program set (TPS) developed by test engineers. The same USB 3.0 SI, including the test commands, can then be reused on other ATEs and UUTs with the same bus. This can be an industry-wide game changer when SIs are developed for other I/O buses and applications. Utilizing SIs reduces TPS development costs and ATE expenditures, while improving TPS development times and effort.

中文翻译：

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使用合成仪器将高速I / O功能添加到军事自动测试设备（ATE）中

数字传输的高速测试需要功能测试，该功能测试通常是由自动测试设备（ATE）对军用和航空电子被测件（UUT）进行的测试。较早的军用ATE，乃至大多数现代ATE，都没有配备用于高速数据传输的测试仪器。通常，此类高速测试仪器被设计用于设计验证测试中的信号表征，这需要人工解释。军事ATE的主要目的是允许非技术士兵或水手全面测试和诊断所有类型的电子设备，并得出非常具体的维修说明。我们将介绍综合仪器（SI），并展示它们如何为传统ATE提供可行的选择，同时它们也能够测试高速被测设备（UUT）信号。高速SI解决方案可以取代现有的ATE，甚至取代传统的ATE，而不是取代军用ATE。这种方法的明显好处是可以延长ATE的使用寿命，并具有测试当前甚至未来电路类型的能力。它还允许军事ATE测试多Gbps信号，从而提高其性能。讨论了高速I / O，例如以5 Gbps工作的USB 3.0。（尽管为了使本文保持一致，USB 3.0最近被重命名为USB 3.2 Gen 1，但我们使用传统术语USB 3.0。）该示例利用了专用USB 3.0 SI来响应测试程序集（TPS）中的命令由测试工程师开发。然后可以使用同一总线在其他ATE和UUT上重用相同的USB 3.0 SI（包括测试命令）。当为其他I / O总线和应用程序开发SI时，这可能是整个行业的游戏规则改变者。利用SI可以减少TPS开发成本和ATE支出，同时缩短TPS开发时间和工作量。