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Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy.
ChemPhysChem ( IF 2.3 ) Pub Date : 2020-08-21 , DOI: 10.1002/cphc.202000568
Elmar Kataev 1 , Daniel Wechsler 1 , Federico J Williams 2 , Julia Köbl 1 , Natalia Tsud 3 , Stefano Franchi 4 , Hans-Peter Steinrück 1 , Ole Lytken 1
Affiliation  

Thin‐film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X‐ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated assuming a uniform thickness across a surface. This results in an error for rough films, and the magnitude of this error depends on the kinetic energy of the photoelectrons analyzed. We have used this kinetic‐energy dependency to estimate the roughnesses of thin porphyrin films grown on rutile TiO2(110). We used two different molecules: cobalt (II) monocarboxyphenyl‐10,15,20‐triphenylporphyrin (CoMCTPP), with carboxylic‐acid anchor groups, and cobalt (II) tetraphenylporphyrin (CoTPP), without anchor groups. We find CoMCTPP to grow as rough films at room temperature across the studied coverage range, whereas for CoTPP the first two layers remain smooth and even; depositing additional CoTPP results in rough films. Although, XPS is not a common technique for measuring roughness, it is fast and provides information of both roughness and thickness in one measurement.

中文翻译:

用 X 射线光电子能谱探测卟啉薄膜的粗糙度。

分子系统的薄膜生长对许多应用都很感兴趣,例如有机电子学。在这项研究中,我们展示了如何使用 X 射线光电子能谱 (XPS) 来研究此类分子系统的生长行为。在 XPS 中,通常假设整个表面的厚度均匀来计算覆盖范围。这会导致粗糙薄膜产生误差,并且该误差的大小取决于所分析的光电子的动能。我们利用这种动能依赖性来估计在金红石 TiO 2 (110) 上生长的卟啉薄膜的粗糙度。我们使用了两种不同的分子:带有羧酸锚定基团的单羧基苯基-10,15,20-三苯基卟啉钴(II)(CoMCTPP)和不带锚定基团的四苯基卟啉钴(II)(CoTPP)。我们发现 CoMCTPP 在室温下在研究的覆盖范围内生长为粗糙薄膜,而对于 CoTPP,前两层保持光滑均匀;沉积额外的 CoTPP 会导致薄膜粗糙。尽管 XPS 不是测量粗糙度的常用技术,但它速度很快,并且在一次测量中同时提供粗糙度和厚度信息。
更新日期:2020-10-19
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