Random illumination microscopy (RIM) using uncontrolled speckle patterns has shown the capacity to surpass the Abbe’s diffraction barrier, providing the possibility to design inexpensive and versatile structured illumination microscopy (SIM) devices. In this paper, I first present a review of the state-of-the-art joint reconstruction methods in RIM, and then propose a unified joint reconstruction approach in which the performance of various regularization terms can be evaluated under the same model. The model hyperparameter is easily tuned and robust in comparison to the previous methods and ℓ_2,1 regularizer is proven to be a reasonable prior in most practical situations. Moreover, the degradation entailed by out-of-focus light in conventional SIM can be easily solved in RIM setup.

中文翻译：

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随机照明显微镜的统一联合重建方法


使用不受控制的散斑图案的随机照明显微镜 (RIM) 已显示出超越阿贝衍射势垒的能力，为设计廉价且通用的结构照明显微镜 (SIM) 设备提供了可能性。在本文中，我首先回顾了 RIM 中最先进的联合重建方法，然后提出了一种统一的联合重建方法，其中可以在同一模型下评估各种正则化项的性能。与之前的方法相比，模型超参数易于调整且稳健，并且 ℓ _2,1正则化器被证明在大多数实际情况下是合理的先验。此外，传统 SIM 中离焦光带来的性能下降可以在 RIM 设置中轻松解决。