Random illumination microscopy (RIM) using uncontrolled speckle patterns has shown the capacity to surpass the Abbe’s diffraction barrier, providing the possibility to design inexpensive and versatile structured illumination microscopy (SIM) devices. In this paper, I first present a review of the state-of-the-art joint reconstruction methods in RIM, and then propose a unified joint reconstruction approach in which the performance of various regularization terms can be evaluated under the same model. The model hyperparameter is easily tuned and robust in comparison to the previous methods and ℓ_2,1 regularizer is proven to be a reasonable prior in most practical situations. Moreover, the degradation entailed by out-of-focus light in conventional SIM can be easily solved in RIM setup.

中文翻译：

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统一联合重建方法用于随机照明显微镜

使用不受控制的散斑图案的随机照明显微镜（RIM）已显示出超过阿贝衍射屏障的能力，为设计廉价且通用的结构化照明显微镜（SIM）设备提供了可能性。在本文中，我首先介绍了RIM中最新的联合重建方法，然后提出了一种统一的联合重建方法，其中可以在同一模型下评估各种正则化项的性能。与以前的方法相比，该模型的超参数易于调整且健壮，并且在大多数实际情况下，_ℓ2,1正则化证明是合理的先验。此外，在RIM设置中，可以轻松解决传统SIM卡中因散焦而导致的性能下降。