Abstract The adhesion force between the surfaces and various compounds is a fundamental feature that causes formation and modification of compounds and can be used to various applications. Adhesion force performs in several main ways that recognition and monitoring of this force would be very useful in the material study. Atomic force microscope (AFM) is a modern precisionist device which has been able to examine and closely monitor the adhesion force at the nanometer scale. The interaction forces between AFM tip and sample surface are considered to investigate the adhesion force. It can be applied to wide ranges of materials which are important in current modern industries such as pharmaceutical compounds, polymers, nanomaterials, and semiconductors.

中文翻译：

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原子力显微镜在粘附力测量中的应用

摘要 表面与各种化合物之间的粘附力是引起化合物形成和改性的基本特征，可用于各种应用。粘附力以几种主要方式发挥作用，识别和监测这种力在材料研究中非常有用。原子力显微镜 (AFM) 是一种现代精密设备，能够检查和密切监测纳米级的粘附力。考虑 AFM 尖端和样品表面之间的相互作用力来研究粘附力。它可以应用于当前现代工业中很重要的各种材料，例如药物化合物、聚合物、纳米材料和半导体。