The development of materials is strongly related to our capability of understanding thermal, mechanical and chemical processing on the nanoscale. Unravelling the interface structure is crucial for opening new regimes in property–performance space. Interface arrangements have been characterized by statistically limited microscopy techniques. In this work, a large-angular-range detector was used for synchrotron diffraction measurements on commercially pure Mg. Long acquisitions allowed the retrieval of preferred interface configurations through the observation of extraordinary diffraction peaks located close to the Mg 102, 200, 204 and 300 fundamental reflections. A kinematical simulation scanning possible interface structures established the correspondence of the non-bulk peaks to the interfacial organization of atoms that may be responsible for their appearance. Simulated interfaces were probed for a wide range of angular displacements with respect to the main cleavage planes. The results indicate configurations that allow the observation of X-ray diffraction, representing a long-range-ordered pattern of atomic distributions in Mg. The introduced methodology allows for nondestructive monitoring of systems that undergo processes that modify grain sizes and grain-interface orientation.

中文翻译：

---

通过非凡的 X 射线反射分析检索多晶材料中晶界结构的构型

材料的发展与我们理解纳米级热、机械和化学加工的能力密切相关。解开界面结构对于在性能-性能空间中开辟新的制度至关重要。界面布置的特点是统计上有限的显微技术。在这项工作中，大角范围探测器用于对商业纯镁进行同步加速器衍射测量。长时间采集允许通过观察靠近 Mg 102、200、204 和 300 基本反射的非凡衍射峰来检索首选界面配置。扫描可能的界面结构的运动学模拟建立了非体峰与原子界面组织的对应关系，这可能是造成它们出现的原因。模拟界面被探测到相对于主解理面的各种角位移。结果表明可以观察 X 射线衍射的配置，代表 Mg 中原子分布的长程有序模式。引入的方法允许对经过修改晶粒尺寸和晶粒界面取向的过程的系统进行无损监测。代表镁中原子分布的长程有序模式。引入的方法允许对经过修改晶粒尺寸和晶粒界面取向的过程的系统进行无损监测。代表镁中原子分布的长程有序模式。引入的方法允许对经过修改晶粒尺寸和晶粒界面取向的过程的系统进行无损监测。