Thermal bridge method is widely used in thermal conductance measurements of one-dimensional nanostructures. The studies used by thermal bridge method advances our understanding of one-dimensional nanoscale thermal transport. And many efforts have been made to boost the reliability of the thermal bridge method and improve the measurement sensitivity. In this paper, uncertainty analysis is performed on the thermal bridge measurements of a CNT and a CdSe nanowire. Both the Taylor series method and the Monte Carlo method are used to figure out the propagation of the errors in the direct measurements. Our results show that the uncertainty of the thermal conductance decreases as the thermal conductance of the measured sample decreases, which can be attributed to the increase in the temperature drop on the measured sample. This finding indicates that we can reduce the measurement uncertainty by increasing the measured length of the sample or increasing the Joule heating generated on the heat source.

中文翻译：

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热桥法的不确定度分析

热桥法广泛用于一维纳米结构的热导测量。热桥方法使用的研究增进了我们对一维纳米级热传输的理解。并且已经做出许多努力来提高热桥方法的可靠性和提高测量灵敏度。在本文中，对 CNT 和 CdSe 纳米线的热桥测量进行了不确定性分析。泰勒级数方法和蒙特卡罗方法都用于计算直接测量中误差的传播。我们的结果表明，热导的不确定度随着被测样品的热导降低而降低，这可以归因于被测样品的温降增加。