Printed circuit boards (PCB) are the most important and valuable building block of electronic equipment. This metallic fraction present in the PCB is one of the major economic drivers for its recycling. However, the separated nonmetal fraction (NMF) that accounts for approximately 70% of the total weight is usually sent to the landfills.

Recently, physical NMF recycling has gained much attention, and loss on ignition (LOI) is one of the most common methods to estimate the content of organic matter in the NMF. This study aimed to establish a standard test parameter that could determine the total organic and inorganic content in the tested NMF. The effect of sample pulverization on the LOI was also studied. The results provided the optimal temperature, size, and duration for conducting organic content analysis for the NMF and suggested that the LOI test conducted on the as-received sample at 750°C for 3 hours provides sufficient time for the organic content analysis. It indicated that the test should be conducted in triplicates using a 1-gram sample, and the results should be averaged.

印刷电路板（PCB）是电子设备最重要，最有价值的组成部分。PCB中存在的这种金属成分是其回收利用的主要经济动力之一。但是，通常将约占总重量70％的分离出的非金属部分（NMF）发送到垃圾填埋场。

近年来，物理NMF回收备受关注，灼烧损失（LOI）是估算NMF中有机物含量的最常用方法之一。这项研究旨在建立一个标准测试参数，该参数可以确定被测NMF中的总有机和无机含量。还研究了样品粉碎对LOI的影响。结果为进行NMF的有机物含量分析提供了最佳温度，尺寸和持续时间，并表明在750°C下对原样进行3小时的LOI测试可以为有机物含量分析提供足够的时间。它表示应使用1克样品一式三份进行测试，并对结果取平均值。