We have developed highly interleaved zigzag-shaped electrodes for collecting charge on the readout plane of various micropattern gaseous detectors (MPGDs), including gas electron multiplier (GEM) and micromega detectors. An optimized zigzag pad (or strip) anode can greatly enhance charge sharing among neighboring pads compared to traditional straight strip or rectangular pad designs and as a result can deliver excellent position resolution with minimal channel count, while exhibiting a virtually uniform response across the detector. We have systematically studied the effects of varying the parameters that define the zigzag geometry using simulations and have measured several printed circuit boards (PCBs) comprising a range of zigzag designs. Recently, we have employed laser ablation to generate zigzag patterns with pad-to-pad gaps smaller than 1 mil (or 25 $\mu \text{m}$ ). Reducing the gap well below the 3-mil limit imposed by traditional chemical etching has allowed the production of zigzag electrodes with unprecedentedly small feature sizes. In turn, laser-etched zigzag PCBs were shown to exhibit markedly improved performance over earlier generation PCBs, with position resolutions below 50 $\mu \text{m}$ for a 2-mm pitch. This article will explore in detail the dependence of the position resolution on the structural parameters of a zigzag-shaped anode, specifically for the case of a quadruple GEM detector.

中文翻译：

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使用带 GEM 探测器的锯齿形设计研究高分辨率读出平面

我们开发了高度交错的锯齿形电极，用于在各种微图案气体探测器 (MPGD) 的读出平面上收集电荷，包括气体电子倍增器 (GEM) 和微型探测器。与传统的直条形或矩形焊盘设计相比，优化的锯齿形焊盘（或条形）阳极可以大大增强相邻焊盘之间的电荷共享，因此可以以最少的通道数提供出色的位置分辨率，同时在整个检测器上表现出几乎一致的响应。我们使用模拟系统地研究了改变定义锯齿形几何形状的参数的影响，并测量了包括一系列锯齿形设计的多个印刷电路板 (PCB)。最近，我们采用激光烧蚀来生成焊盘到焊盘间隙小于 1 百万（或 25 $\mu \text{m}$ ）的锯齿形图案。将间隙减少到远低于传统化学蚀刻所施加的 3 密耳限制，可以生产具有前所未有的小特征尺寸的锯齿形电极。反过来，激光蚀刻的锯齿形 PCB 与前一代 PCB 相比表现出显着改善的性能，位置分辨率低于 50 $\mu \text{m}$（对于 2 毫米间距）。本文将详细探讨位置分辨率对锯齿形阳极结构参数的依赖性，特别是对于四重 GEM 探测器的情况。将间隙减少到远低于传统化学蚀刻所施加的 3 密耳限制，可以生产具有前所未有的小特征尺寸的锯齿形电极。反过来，激光蚀刻的锯齿形 PCB 与前一代 PCB 相比表现出显着改善的性能，位置分辨率低于 50 $\mu \text{m}$（对于 2 毫米间距）。本文将详细探讨位置分辨率对锯齿形阳极结构参数的依赖性，特别是对于四重 GEM 探测器的情况。将间隙减少到远低于传统化学蚀刻所施加的 3 密耳限制，可以生产具有前所未有的小特征尺寸的锯齿形电极。反过来，激光蚀刻的锯齿形 PCB 与前一代 PCB 相比表现出显着改善的性能，位置分辨率低于 50 $\mu \text{m}$（对于 2 毫米间距）。本文将详细探讨位置分辨率对锯齿形阳极结构参数的依赖性，特别是对于四重 GEM 探测器的情况。