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Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence.
Journal of Synchrotron Radiation ( IF 2.4 ) Pub Date : 2020-08-17 , DOI: 10.1107/s1600577520009868
Nami Nakamura 1 , Satoshi Matsuyama 1 , Takato Inoue 1 , Ichiro Inoue 2 , Jumpei Yamada 1 , Taito Osaka 1 , Makina Yabashi 2 , Tetsuya Ishikawa 2 , Kazuto Yamauchi 1
Affiliation  



中文翻译:

通过 X 射线荧光强度相关测量来表征 X 射线自由电子激光器的焦点。

更新日期:2020-09-03
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