The operation of a high-temperature superconducting (HTS) device is strongly related to its electromagnetic environment. It is necessary to study the electromagnetic interaction of proximity HTS tapes placed in the horizontal or vertical direction, which is important for the design and optimization of HTS devices. This paper presents a numerical model of periodically arranged HTS tapes using the finite element method (FEM). The numerical method has been developed to build the equivalent periodical arrangement of infinite HTS tapes and applied to simulate two basic arrangements, horizontal and vertical periodical arrangements. The magnetic field and current distributions of HTS tapes by periodical arrangements have been investigated. The effects on critical current with different arrangements have been illustrated. It is found that the Y-stack can reduce the current carrying capacity while the X-array can increase that in comparison to a single tape. The differences between the FEM results and analytical models have been analysed and also compared with the Norris model. The two mathematical models derived for AC loss prediction have shown higher accuracy than the existing analytical models. This study presents an effective method to optimize the electromagnetic environment and estimate the AC loss, shows the phenomenon of central tapes in a HTS array, which could be potentially used in performance analysis of superconducting devices, e.g. HTS transformers.

高温超导（HTS）器件的操作与其电磁环境密切相关。有必要研究水平或垂直方向放置的邻近高温超导带的电磁相互作用，这对于高温超导器件的设计和优化很重要。本文提出了一种使用有限元方法（FEM）周期性布置HTS磁带的数值模型。已经开发了数值方法以建立无限的HTS磁带的等效周期排列，并应用于模拟两个基本排列，即水平和垂直周期排列。已经研究了按周期排列的高温超导带的磁场和电流分布。已经说明了不同布置对临界电流的影响。发现与单个磁带相比，Y堆栈可以减小载流能力，而X阵列可以增加载流能力。分析了有限元结果与分析模型之间的差异，并与Norris模型进行了比较。推导出的用于交流损耗预测的两个数学模型显示出比现有分析模型更高的准确性。这项研究提出了一种优化电磁环境并估计AC损耗的有效方法，显示了HTS阵列中的中心带现象，该现象可能会用于超导设备（例如HTS变压器）的性能分析。分析了有限元结果与分析模型之间的差异，并与Norris模型进行了比较。推导出的用于交流损耗预测的两个数学模型显示出比现有分析模型更高的准确性。这项研究提出了一种优化电磁环境并估计AC损耗的有效方法，显示了HTS阵列中的中心带现象，该现象可能会用于超导设备（例如HTS变压器）的性能分析。分析了有限元结果与分析模型之间的差异，并与Norris模型进行了比较。推导出的用于交流损耗预测的两个数学模型显示出比现有分析模型更高的准确性。这项研究提出了一种优化电磁环境并估计AC损耗的有效方法，显示了HTS阵列中的中心带现象，该现象可能会用于超导设备（例如HTS变压器）的性能分析。