S-parameter de-embedding methods require multiple fixtures to be identical. However, due to manufacturing variations, the fixtures are never perfectly identical, which violates the assumptions for the de-embedding algorithms and, in turn, introduces errors. In this article, a novel methodology is proposed to estimate the errors due to de-embedding for practical transmission line measurements. The circuit models of the thru and total lines with fixtures are created. Perturbation in the fixtures is introduced based on the fixture variation estimated by time-domain reflectometry measurements. The method can predict the envelope and estimate the confidence interval of the de-embedded insertion loss using a limited number of simulation cases.

中文翻译：

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基于夹具统计电路模型的S参数去嵌入误差估计

S 参数去嵌入方法要求多个夹具相同。然而，由于制造差异，夹具永远不会完全相同，这违反了去嵌入算法的假设，进而引入了错误。在本文中，提出了一种新颖的方法来估计实际传输线测量中去嵌入引起的误差。创建带有夹具的直通线和总线的电路模型。夹具中的扰动是根据时域反射测量估计的夹具变化引入的。该方法可以使用有限数量的仿真案例来预测包络并估计去嵌入插入损耗的置信区间。