X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals,Journal of Applied Crystallography

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X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals
Journal of Applied Crystallography ( IF 5.2 ) Pub Date : 2020-07-30 , DOI: 10.1107/s1600576720008961
Thomas Wicht ₁ , Stephan Müller ₁ , Roland Weingärtner ₁ , Boris Epelbaum ₁ , Sven Besendörfer ₁ , Ulrich Bläß ₁ , Matthias Weisser ₂ , Tobias Unruh ₂ , Elke Meissner _{1,

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Affiliation

AlN single crystals grown by physical vapor transport have been analyzed by X-ray methods to evaluate dislocation types, densities and spatial distribution within the crystal. Potential changes of the AlN crystal quality during growth, both within the axial growth direction and within lateral expansion areas, have been investigated.

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