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Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
Journal of Applied Crystallography ( IF 5.2 ) Pub Date : 2020-07-08 , DOI: 10.1107/s1600576720006925
Andrew J Morgan 1 , Kevin T Murray 2 , Mauro Prasciolu 2 , Holger Fleckenstein 1 , Oleksandr Yefanov 1 , Pablo Villanueva-Perez 1 , Valerio Mariani 1 , Martin Domaracky 1 , Manuela Kuhn 2 , Steve Aplin 1 , Istvan Mohacsi 2 , Marc Messerschmidt 3 , Karolina Stachnik 2 , Yang Du 1 , Anja Burkhart 2 , Alke Meents 2 , Evgeny Nazaretski 4 , Hanfei Yan 4 , Xiaojing Huang 4 , Yong S Chu 4 , Henry N Chapman 1, 5, 6 , Saša Bajt 2, 5
Affiliation  

Simultaneous wavefront metrology and sample projection imaging with multi-layer Laue lenses using the ptychographic X-ray speckle tracking technique is described. Results from three experiments are presented.

中文翻译:


使用多层劳厄透镜系统进行叠层X射线散斑跟踪



描述了使用叠层记录 X 射线散斑跟踪技术的多层劳厄透镜的同步波前计量和样品投影成像。给出了三个实验的结果。
更新日期:2020-07-08
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