Ptychographic X-ray speckle tracking with multi-layer Laue lens systems,Journal of Applied Crystallography

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Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
Journal of Applied Crystallography ( IF 5.2 ) Pub Date : 2020-07-08 , DOI: 10.1107/s1600576720006925
Andrew J Morgan ₁ , Kevin T Murray ₂ , Mauro Prasciolu ₂ , Holger Fleckenstein ₁ , Oleksandr Yefanov ₁ , Pablo Villanueva-Perez ₁ , Valerio Mariani ₁ , Martin Domaracky ₁ , Manuela Kuhn ₂ , Steve Aplin ₁ , Istvan Mohacsi ₂ , Marc Messerschmidt ₃ , Karolina Stachnik ₂ , Yang Du ₁ , Anja Burkhart ₂ , Alke Meents ₂ , Evgeny Nazaretski ₄ , Hanfei Yan ₄ , Xiaojing Huang ₄ , Yong S Chu ₄ , Henry N Chapman _{1,

5,

6} , Saša Bajt _{2,

5}

Affiliation

Simultaneous wavefront metrology and sample projection imaging with multi-layer Laue lenses using the ptychographic X-ray speckle tracking technique is described. Results from three experiments are presented.

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