White beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection.

中文翻译：

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无位错高纯锗单晶中空洞的动态 X 射线衍射成像

已执行白束 X 射线形貌以提供无位错高纯锗单晶中微孔洞的直接证据。提出了一种通用方法来验证任何结构完美的结晶材料是否存在空隙。