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Dual-energy crystal-analyzer scheme for spectral tomography
Journal of Applied Crystallography ( IF 5.2 ) Pub Date : 2020-05-27 , DOI: 10.1107/s1600576720005439
Denis Zolotov 1 , Alexey Buzmakov 1 , Maxim Grigoriev 2 , Igor Schelokov 1, 2
Affiliation  

In the present work, a method for adjusting a crystal analyzer to separate two characteristic lines from the spectrum of a conventional X-ray tube for simultaneous registration of tomographic projections is proposed. The experimental implementation of this method using radiation of a molybdenum anode (Kα1, Kβ lines) and a silicon Si(111) crystal analyzer in Laue geometry is presented. Projection images at different wavelengths are separated in space and can be recorded independently for further processing. Potential uses of this scheme are briefly discussed.

中文翻译:


用于光谱断层扫描的双能晶体分析仪方案



在本工作中,提出了一种调整晶体分析仪以从传统 X 射线管的光谱中分离两条特征线以同时配准断层投影的方法。介绍了使用钼阳极辐射(Kα1、Kβ 线)和劳厄几何中的硅 Si(111) 晶体分析仪来实验实现该方法。不同波长的投影图像在空间上分离,可以独立记录以供进一步处理。简要讨论了该方案的潜在用途。
更新日期:2020-05-27
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