A method for the simultaneous measurement of a wavefront’s phase and the projection hologram of an unknown sample is presented. This method relies on an updated form of the speckle tracking approximation, which is based on a second-order expansion of the Fresnsel integral.

中文翻译：

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叠层X射线散斑追踪


提出了一种同时测量未知样品的波前相位和投影全息图的方法。该方法依赖于散斑跟踪近似的更新形式，该近似基于菲涅耳积分的二阶展开。