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Ptychographic X-ray speckle tracking
Journal of Applied Crystallography ( IF 5.2 ) Pub Date : 2020-05-29 , DOI: 10.1107/s1600576720005567
Andrew J Morgan 1, 2 , Harry M Quiney 1 , Saša Bajt 3, 4 , Henry N Chapman 2, 4, 5
Affiliation  

A method for the simultaneous measurement of a wavefront’s phase and the projection hologram of an unknown sample is presented. This method relies on an updated form of the speckle tracking approximation, which is based on a second-order expansion of the Fresnsel integral.

中文翻译:


叠层X射线散斑追踪



提出了一种同时测量未知样品的波前相位和投影全息图的方法。该方法依赖于散斑跟踪近似的更新形式,该近似基于菲涅耳积分的二阶展开。
更新日期:2020-05-29
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