This article reports a time-resolved fluorescence data acquisition technique termed as “Total Emission Time Resolved Decay” (TETRD). TETRD is recorded by using zero-order diffraction of emission grating in TCSPC instrument. TETRD decay curve has entire wavelength dependent decay information buried in it. Cut-off filters are used to avoid scattering contamination. Two existing approaches are used for analysing the interconnected TETRD data. (i) First, global analysis: for discretely decaying multiple components, TETRD dataset is analyzed using global analysis. The normalized pre-exponentials (α_i) and relative amplitudes (f_i) recovered from global analysis reflect the individual component emission more faithfully and resembles with steady-state spectral data as well. (ii) Second, stretched exponential fitting (StrEF): for continuous lifetime distribution systems, StrEF (I(t) = I₀ exp[−(t/τ)^1/h]) has been used to analyse TETRD data. The average lifetime (τ) of StrEF matches well with the average lifetime of multi-exponential fitting, the heterogeneity factor (h) of StrEF is an additional parameter, which informs about local heterogeneity in the system. It is shown that the lifetimes obtained with TETRD matches well with the lifetimes obtained using conventional time resolved emission spectra (TRES). TETRD holds advantage in rapid data acquisition and facilitates inclusion of another variable (like concentration, solvent composition, pH, excitation wavelength etc.) into experimental design. Further, with the use of an appropriate data analysis tool, the multi-component decay profiles can be resolved conveniently.

中文翻译：

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总发射时间分辨衰减：一种测量和解决宽带发射的方法。

本文报道了一种称为“总发射时间分辨衰减”(TETRD) 的时间分辨荧光数据采集技术。TETRD 是通过 TCSPC 仪器中发射光栅的零级衍射记录的。TETRD 衰减曲线中隐藏了整个波长相关的衰减信息。截止滤光片用于避免散射污染。两种现有方法用于分析互连的 TETRD 数据。(i) 首先，全局分析：对于离散衰减的多个组件，使用全局分析对 TETRD 数据集进行分析。归一化前指数 ( α _i ) 和相对振幅 ( f _i) 从全局分析中恢复，更忠实地反映了单个组件的发射，并且也类似于稳态光谱数据。(ii) 其次，拉伸指数拟合 (StrEF)：对于连续寿命分布系统，StrEF ( I ( t ) =  I ₀  exp[−( t / τ ) ^{1/ h} ]) 已用于分析 TET​​RD 数据。StrEF 的平均寿命 ( τ ) 与多指数拟合的平均寿命、异质性因子 ( h) 的 StrEF 是一个附加参数，它告知系统中的局部异质性。结果表明，使用 TETRD 获得的寿命与使用传统时间分辨发射光谱 (TRES) 获得的寿命非常匹配。TETRD 在快速数据采集方面具有优势，并有助于将另一个变量（如浓度、溶剂成分、pH、激发波长等）纳入实验设计。此外，通过使用适当的数据分析工具，可以方便地解析多组分衰减曲线。