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Spectroscopic ellipsometry studies of an electrochemically synthesized molecularly imprinted polymer for the detection of an aviation biokerosene contaminant
Reactive & Functional Polymers ( IF 4.5 ) Pub Date : 2020-08-11 , DOI: 10.1016/j.reactfunctpolym.2020.104698
E. Buffon , J.A.O. Huguenin , L. da Silva , P.A. Carneiro , N.R. Stradiotto

The present work reports the use of spectroscopic ellipsometry to study the properties of molecularly imprinted poly(ortho-phenylenediamine) film. This polymer was electrosynthesized by cyclic voltammetry and applied for the detection of hexahydrofarnesol, which is the main contaminant of aviation biokerosene. Ellipsometry was used to obtain the thickness of the polymeric film and to investigate the optical and dielectric properties of this material. The results obtained showed that the optical properties and dielectric constants of the molecularly imprinted polymer were sensitive to the presence or absence of the hexahydrofarnesol molecule. Detection studies for this molecule showed that the modified electrode responds linearly in two distinct concentration ranges: 5.0 × 10−8 to 1.3 × 10−7 mol L−1 and 3.0 × 10−7 to 1.5 × 10−6 mol L−1, with the first linear range presenting a sensitivity 27.3 times higher than the second range. This is in line with the behavior of the optical properties (refractive index and extinction coefficient) of the polymeric film, which pointed to the presence of a larger number of imprinted cavities in the non-homogeneous part of the polymer. Essentially, this study proved that, apart from measuring film thickness, spectroscopic ellipsometry is a powerful tool for the characterization of molecularly imprinted polymers.



中文翻译:

电化学合成分子印迹聚合物的椭圆偏振光谱研究,用于检测航空生物煤油污染物

本工作报道了使用光谱椭圆偏振法研究分子印迹聚(邻苯二胺)薄膜的性能。该聚合物通过循环伏安法进行电合成,并用于检测六氢法尼醇,后者是航空生物煤油的主要污染物。椭偏法用于获得聚合物膜的厚度并研究该材料的光学和介电性能。获得的结果表明,分子印迹聚合物的光学性质和介电常数对六氢法尼醇分子的存在或不存在敏感。对这种分子的检测研究表明,修饰的电极在两个不同的浓度范围内线性响应:5.0×10 -8至1.3×10 -7 mol L -1和3.0×10 -7至1.5×10 -6  mol L -1,第一线性范围的灵敏度比第二范围高27.3倍。这与聚合物膜的光学性质(折射率和消光系数)的行为一致,这表明在聚合物的非均质部分中存在大量的压印腔。本质上,这项研究证明,除了测量膜厚之外,椭圆偏振光谱法还是表征分子印迹聚合物的有力工具。

更新日期:2020-08-11
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