Alexandria Engineering Journal ( IF 6.2 ) Pub Date : 2020-08-09 , DOI: 10.1016/j.aej.2020.07.039 Naveed Anjum , Ji-Huan He
A significant phenomenon associated with devices used in nano/microelectromechanical systems (N/MEMS) is the dynamic pull-in instability. The basic theme of this manuscript is to study the nonlinear oscillation and dynamic pull-in instability in an N/MEMS switch with a current carrying conductor due to magnetic force. The variational iteration method accompanied by the techniques of the Laplace transform is used to find the approximate nonlinear frequency and approximate analytic solution of the model problem. The critical condition for the pull-in threshold is successfully obtained, which is extremely useful for the optimal design of N/MEMS. The effects of parameters on the frequency and the solution are discussed as well. The present findings exceptionally agree with the numerical results obtained by the Runge-Kutta method of order four and also give better accuracy when compared to other methods.
中文翻译:
零初始条件下电磁力引起的纳米/微机电系统开关的非线性振动分析
与纳米/微机电系统(N / MEMS)中使用的设备相关的重要现象是动态引入不稳定性。该手稿的基本主题是研究带有磁力的载流导体的N / MEMS开关的非线性振荡和动态引入不稳定性。伴随Laplace变换技术的变分迭代法被用于寻找模型问题的近似非线性频率和近似解析解。成功获得了引入阈值的临界条件,这对于N / MEMS的最佳设计非常有用。还讨论了参数对频率和解的影响。