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Machine learning for predicting the average length of vertically aligned TiO2nanotubes
Aip Advances ( IF 1.4 ) Pub Date : 2020-07-21 , DOI: 10.1063/5.0012410
Jesús Caro-Gutiérrez 1 , Félix F. González-Navarro 1 , Mario A. Curiel-Álvarez 1 , Oscar M. Peréz-Landeros 1 , Benjamín Valdez-Salas 1 , Nicola Radnev-Nedev 1
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Technological advances depend on the study of specific materials, such as TiO2 nanotubes that have a variety of applications in different industries due to their properties. These properties are directly related to the nanotubes, size, for example, with their length; hence, measuring this dimension accurately is important. Nowadays, length measurement is performed through semi-automatic functions on scanning electron microscopy images. Time-consuming image analysis, subjective and low-representative readings, and damaged samples are some disadvantages found in this process. This paper presents a proposal for predicting the average length of vertically aligned TiO2 nanotubes using machine learning and ellipsometry because they can overcome the disadvantages mentioned. Different models of measurements of light reflection intensity and ellipsometric parameters predicted the length. The results of a model that showed a low prediction error using linear support vector machines for regression are reported.

中文翻译:

机器学习预测垂直排列的TiO2纳米管的平均长度

技术的进步取决于对特定材料的研究,例如TiO 2纳米管由于其特性而在不同行业中具有多种应用。这些性质与纳米管的大小直接相关,例如与长度有关。因此,准确测量此尺寸非常重要。如今,长度测量是通过半自动功能对扫描电子显微镜图像进行的。费时的图像分析,主观和低代表性的读数以及损坏的样本是此过程中的一些缺点。本文提出了预测垂直排列的TiO 2平均长度的建议纳米管使用机器学习和椭圆偏光法,因为它们可以克服上述缺点。测量光反射强度和椭偏参数的不同模型预测了长度。报告了使用线性支持向量机进行回归的预测误差较低的模型的结果。
更新日期:2020-08-01
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