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RETRO: Reintroducing Tests for Improved Reverse Order Fault Simulation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems ( IF 2.8 ) Pub Date : 2020-08-01 , DOI: 10.1109/tvlsi.2020.2997762
Irith Pomeranz

Reverse order fault simulation and its variations provide a test compaction option with a low computational effort that is applicable even when test constraints or complex fault models preclude the application of other conventional test compaction procedures. This is the scenario considered in this brief. Reverse order fault simulation procedures remove unnecessary tests from a test set without otherwise modifying it. Reverse order fault simulation is typically applied once after the complete test set has been generated. This brief observes that when other test compaction procedures are not applied, forward-looking reverse order fault simulation sometimes yields a smaller test set if it is applied more often during the test generation process. However, applying it more often also increases the computational effort. This brief explains this phenomenon and describes a procedure that uses the new insights to improve the ability of forward-looking reverse order fault simulation to achieve test compaction at a reduced computational effort. The experimental results for benchmark circuits are presented to support the discussion.

中文翻译:

RETRO:重新引入测试以改进逆序故障模拟

逆序故障模拟及其变体提供了一种具有低计算工作量的测试压实选项,即使在测试约束或复杂故障模型排除其他常规测试压实程序的应用时也适用。这是本简介中考虑的场景。逆序故障模拟程序从测试集中删除不必要的测试,而无需对其进行其他修改。逆序故障模拟通常在生成完整的测试集后应用一次。该简介观察到,当不应用其他测试压缩程序时,如果在测试生成过程中更频繁地应用,前瞻性逆序故障模拟有时会产生较小的测试集。然而,更频繁地应用它也会增加计算工作量。本简介解释了这种现象并描述了一个程序,该程序使用新的见解来提高前瞻性逆序故障模拟的能力,以减少计算工作量来实现测试压缩。提供了基准电路的实验结果以支持讨论。
更新日期:2020-08-01
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