Our official English website, www.x-mol.net, welcomes your
feedback! (Note: you will need to create a separate account there.)
Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy
Advanced Science ( IF 14.3 ) Pub Date : 2020-07-29 , DOI: 10.1002/advs.201901391 Owoong Kwon 1 , Daehee Seol 1 , Huimin Qiao 1 , Yunseok Kim 1
Advanced Science ( IF 14.3 ) Pub Date : 2020-07-29 , DOI: 10.1002/advs.201901391 Owoong Kwon 1 , Daehee Seol 1 , Huimin Qiao 1 , Yunseok Kim 1
Affiliation
|
Piezoelectric and ferroelectric materials have garnered significant interest owing to their excellent physical properties and multiple potential applications. Accordingly, the need for evaluating piezoelectric and ferroelectric properties has also increased. The piezoelectric and ferroelectric properties are evaluated macroscopically using laser interferometers and polarization–electric field loop measurements. However, as the research focus is shifted from bulk to nanosized materials, scanning probe microscopy (SPM) techniques have been suggested as an alternative approach for evaluating piezoelectric and ferroelectric properties. In this Progress Report, the recent progress on the nanoscale evaluation of piezoelectric and ferroelectric properties of diverse materials using SPM‐based methods is summarized. Among the SPM techniques, the focus is on recent studies that are related to piezoresponse force microscopy and conductive atomic force microscopy; further, the utilization of these two modes to understand piezoelectric and ferroelectric properties at the nanoscale level is discussed. This work can provide guidelines for evaluating the piezoelectric and ferroelectric properties of materials based on SPM techniques.
中文翻译：
通过扫描探针显微镜评估压电和铁电性能的纳米级最新进展
压电和铁电材料由于其优异的物理性能和多种潜在的应用而引起了人们的极大兴趣。因此，评估压电和铁电特性的需求也增加了。使用激光干涉仪和极化电场环路测量对压电和铁电特性进行宏观评估。然而，随着研究重点从块体材料转向纳米材料，扫描探针显微镜（SPM）技术被建议作为评估压电和铁电特性的替代方法。在本进展报告中，总结了使用基于 SPM 的方法对各种材料的压电和铁电性能进行纳米级评估的最新进展。在SPM技术中，重点是与压电响应力显微镜和传导原子力显微镜相关的最新研究；此外，还讨论了利用这两种模式来了解纳米级压电和铁电特性。这项工作可以为基于 SPM 技术评估材料的压电和铁电性能提供指导。
更新日期：2020-09-10
中文翻译：
通过扫描探针显微镜评估压电和铁电性能的纳米级最新进展
压电和铁电材料由于其优异的物理性能和多种潜在的应用而引起了人们的极大兴趣。因此，评估压电和铁电特性的需求也增加了。使用激光干涉仪和极化电场环路测量对压电和铁电特性进行宏观评估。然而，随着研究重点从块体材料转向纳米材料，扫描探针显微镜（SPM）技术被建议作为评估压电和铁电特性的替代方法。在本进展报告中，总结了使用基于 SPM 的方法对各种材料的压电和铁电性能进行纳米级评估的最新进展。在SPM技术中，重点是与压电响应力显微镜和传导原子力显微镜相关的最新研究；此外，还讨论了利用这两种模式来了解纳米级压电和铁电特性。这项工作可以为基于 SPM 技术评估材料的压电和铁电性能提供指导。
京公网安备 11010802027423号