Optimal parameters in variable‐velocity scanning luminescence lifetime microscopy,Microscopy Research and Technique

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Optimal parameters in variable‐velocity scanning luminescence lifetime microscopy
Microscopy Research and Technique ( IF 2.0 ) Pub Date : 2020-07-28 , DOI: 10.1002/jemt.23566
Zdeněk Petrášek ₁ , Juan M Bolivar ₁ , Bernd Nidetzky _{1,

2}

Affiliation

We determine the optimal parameters (scan velocities) for measuring the luminescence lifetime on the microsecond scale using the recently introduced method based on scanning the excitation beam across the sample. Using simulations, we evaluate the standard deviation and bias of the luminescence decay rate determined by scanning with two different velocities. The analysis is performed for Poisson‐ and normal‐distributed signals, representing different types of detection techniques. We also show that a weak uncorrected background induces a bias in the obtained decay rate, and take this effect into account when choosing optimal measurement parameters. For comparison, the analysis is additionally performed for two conventional gating schemes for lifetime measurement. The variable‐velocity scanning method is found to be more robust to the effect of the background signal than the gating schemes.

中文翻译：

变速扫描发光寿命显微镜的最佳参数

我们使用最近引入的基于扫描样品上激发光束的方法来确定测量微秒级发光寿命的最佳参数（扫描速度）。通过模拟，我们评估了通过两种不同速度扫描确定的发光衰减率的标准偏差和偏差。对泊松分布和正态分布信号进行分析，代表不同类型的检测技术。我们还表明，弱的未校正背景会导致获得的衰减率出现偏差，并在选择最佳测量参数时考虑到这种影响。为了进行比较，还对两种用于寿命测量的传统门控方案进行了分析。研究发现，变速扫描方法比门控方案对背景信号的影响更加稳健。

更新日期：2020-07-28

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