Abstract

The analytical solution of the problem of the Laue diffraction of an X-ray spherical wave in a single crystal with an inclined step on the exit surface has been obtained. The general equations are used for the specific case of plane wave diffraction in a thick crystal under the Borrmann conditions. It is shown that, provided that the crystal thickness increases from the side of the reflected beam, the reflected-wave relative amplitude is determined by three complex terms. This may formally lead to interference and an increase in the intensity in maxima by a factor of 9 as compared with the crystal without a step. The equation for the transmitted beam contains only two terms, and the corresponding increase in intensity cannot be by more than a factor of 4. The results of analytical calculations coincide with the results obtained by numerical methods and presented in the first part of the work.

中文翻译：

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厚单晶中X射线的劳厄衍射理论，在出射面上有倾斜的台阶。II：分析溶液

摘要

得到了在出射面上具有倾斜台阶的单晶中的X射线球面波的劳厄衍射问题的解析解。一般方程用于在Borrmann条件下厚晶体中平面波衍射的特定情况。可以看出，如果晶体厚度从反射光束的一侧增加，则反射波的相对振幅由三个复项确定。与没有台阶的晶体相比，这可能会正式导致干涉并导致最大强度增加9倍。发射光束的方程式仅包含两个项，并且相应的强度增加不能超过4倍。