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Theory of the Laue Diffraction of X Rays in a Thick Single Crystal with an Inclined Step on the Exit Surface. II: Analytical Solution
Crystallography Reports ( IF 0.6 ) Pub Date : 2020-07-28 , DOI: 10.1134/s1063774520040124 V. G. Kohn , I. A. Smirnova
中文翻译:
厚单晶中X射线的劳厄衍射理论,在出射面上有倾斜的台阶。II:分析溶液
更新日期:2020-07-28
Crystallography Reports ( IF 0.6 ) Pub Date : 2020-07-28 , DOI: 10.1134/s1063774520040124 V. G. Kohn , I. A. Smirnova
Abstract
The analytical solution of the problem of the Laue diffraction of an X-ray spherical wave in a single crystal with an inclined step on the exit surface has been obtained. The general equations are used for the specific case of plane wave diffraction in a thick crystal under the Borrmann conditions. It is shown that, provided that the crystal thickness increases from the side of the reflected beam, the reflected-wave relative amplitude is determined by three complex terms. This may formally lead to interference and an increase in the intensity in maxima by a factor of 9 as compared with the crystal without a step. The equation for the transmitted beam contains only two terms, and the corresponding increase in intensity cannot be by more than a factor of 4. The results of analytical calculations coincide with the results obtained by numerical methods and presented in the first part of the work.中文翻译:
厚单晶中X射线的劳厄衍射理论,在出射面上有倾斜的台阶。II:分析溶液